Local current measurements for avalanche breakdown in Silicon p-n junctions

• Main Authors: Poenar, Daniel P., Ding, Y., Isakov, D. V.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/84747; http://hdl.handle.net/10220/12362
• Institution: Nanyang Technological University

Application of Photon Emission Microscopy (PEM) in semiconductor characterization often shows a linear dependence between emission intensity and biasing current. However, inconclusive understanding of photon emission phenomena in Silicon stopped the research community form applying PEM for local cur...