Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization

Magnetic field spatial fourier analysis : a new opportunity for high resolution current localization

Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot–Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to o...

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書目詳細資料
Main Authors:	Gan, C. L., Lewis, D., Infante, F., Perdu, P., Kor, H. B.
其他作者:	School of Materials Science & Engineering
格式:	Article
語言:	English
出版:	2011
主題:	DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
在線閱讀:	https://hdl.handle.net/10356/85280 http://hdl.handle.net/10220/7243
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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