Microstructure measurement of digital holography
Miniaturization is a development trend of electronics, machinery and information systems, while micro structure brought a large amount of new development for industrial and research applications, whereas, slow measuring speed and two-dimensional results of traditional micro measurement could not mee...
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Main Authors: | Li, Jicheng, Tian, Ailing, Wang, Hongjun, Zhu, Xueliang, Wang, Chunhui, Liu, Bingcai, Asundi, Anand |
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Format: | Conference or Workshop Item |
Language: | English |
Published: |
2018
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/88785 http://hdl.handle.net/10220/46971 |
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Institution: | Nanyang Technological University |
Language: | English |
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