Charging mechanism in a SiO2 matrix embedded with Si nanocrystals
One of the applications of a Si nanocrystals (nc-Si) embedded in a SiO2 matrix is in the area of nonvolatile memory devices based on the charge storage in the material system. However, whether the charge trapping mainly occurs at the nc-Si/SiO2 interface or in the nc-Si is still unclear. In this wor...
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Main Authors: | Fu, Yong Qing, Liu, Yang, Chen, Tupei, Ding, Liang, Zhang, Sam, Fung, Stevenson Hon Yuen |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2010
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/91838 http://hdl.handle.net/10220/6404 |
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Institution: | Nanyang Technological University |
Language: | English |
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