Geometry dependence of gate oxide breakdown evolution

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

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Bibliographic Details
Main Authors:	Sun, Y., Pey, K.L., Tung, C.H., Lombardo, S., Palumbo, F., Tang, L.J., Radhakrishnan, M.K.
Other Authors:	INSTITUTE OF MICROELECTRONICS
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/115432
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-115432
record_format	dspace
spelling	sg-nus-scholar.10635-1154322015-02-19T01:38:05Z Geometry dependence of gate oxide breakdown evolution Sun, Y. Pey, K.L. Tung, C.H. Lombardo, S. Palumbo, F. Tang, L.J. Radhakrishnan, M.K. INSTITUTE OF MICROELECTRONICS Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 57-60 2014-12-12T07:15:33Z 2014-12-12T07:15:33Z 2004 Conference Paper Sun, Y.,Pey, K.L.,Tung, C.H.,Lombardo, S.,Palumbo, F.,Tang, L.J.,Radhakrishnan, M.K. (2004). Geometry dependence of gate oxide breakdown evolution. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 57-60. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/115432 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
author2	INSTITUTE OF MICROELECTRONICS
author_facet	INSTITUTE OF MICROELECTRONICS Sun, Y. Pey, K.L. Tung, C.H. Lombardo, S. Palumbo, F. Tang, L.J. Radhakrishnan, M.K.
format	Conference or Workshop Item
author	Sun, Y. Pey, K.L. Tung, C.H. Lombardo, S. Palumbo, F. Tang, L.J. Radhakrishnan, M.K.
spellingShingle	Sun, Y. Pey, K.L. Tung, C.H. Lombardo, S. Palumbo, F. Tang, L.J. Radhakrishnan, M.K. Geometry dependence of gate oxide breakdown evolution
author_sort	Sun, Y.
title	Geometry dependence of gate oxide breakdown evolution
title_short	Geometry dependence of gate oxide breakdown evolution
title_full	Geometry dependence of gate oxide breakdown evolution
title_fullStr	Geometry dependence of gate oxide breakdown evolution
title_full_unstemmed	Geometry dependence of gate oxide breakdown evolution
title_sort	geometry dependence of gate oxide breakdown evolution
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/115432
_version_	1681094984627912704

Geometry dependence of gate oxide breakdown evolution

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