Growth and Characterization of High Quality Continuous GaN Films on Si-Doped Cracked GaN Templates

Growth and Characterization of High Quality Continuous GaN Films on Si-Doped Cracked GaN Templates

10.1002/1521-396X(200111)188:1<421

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Bibliographic Details
Main Authors:	Chua, S.J., Hao, M., Zhang, J., Sia, E.K.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/56164
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Institution:	National University of Singapore

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