Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements
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sg-nus-scholar.10635-619282015-01-31T06:16:15Z Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements Ling, C.H. Yeow, Y.T. Ah, L.K. ELECTRICAL ENGINEERING Electron device letters 13 11 587-589 EDLED 2014-06-17T06:45:33Z 2014-06-17T06:45:33Z 1992-11 Article Ling, C.H.,Yeow, Y.T.,Ah, L.K. (1992-11). Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements. Electron device letters 13 (11) : 587-589. ScholarBank@NUS Repository. 01938576 http://scholarbank.nus.edu.sg/handle/10635/61928 NOT_IN_WOS Scopus |
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Electron device letters |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Ling, C.H. Yeow, Y.T. Ah, L.K. |
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Ling, C.H. Yeow, Y.T. Ah, L.K. |
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Ling, C.H. Yeow, Y.T. Ah, L.K. Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
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Ling, C.H. |
title |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
title_short |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
title_full |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
title_fullStr |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
title_full_unstemmed |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
title_sort |
characterization of charge trapping in submicrometer nmosfet's by gate capacitance measurements |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/61928 |
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