Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements
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2014
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sg-nus-scholar.10635-619282024-11-08T18:01:29Z Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements Ling, C.H. Yeow, Y.T. Ah, L.K. ELECTRICAL ENGINEERING Electron device letters 13 11 587-589 EDLED 2014-06-17T06:45:33Z 2014-06-17T06:45:33Z 1992-11 Article Ling, C.H.,Yeow, Y.T.,Ah, L.K. (1992-11). Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements. Electron device letters 13 (11) : 587-589. ScholarBank@NUS Repository. 01938576 http://scholarbank.nus.edu.sg/handle/10635/61928 NOT_IN_WOS Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
Electron device letters |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ling, C.H. Yeow, Y.T. Ah, L.K. |
| format |
Article |
| author |
Ling, C.H. Yeow, Y.T. Ah, L.K. |
| spellingShingle |
Ling, C.H. Yeow, Y.T. Ah, L.K. Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
| author_sort |
Ling, C.H. |
| title |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
| title_short |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
| title_full |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
| title_fullStr |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
| title_full_unstemmed |
Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements |
| title_sort |
characterization of charge trapping in submicrometer nmosfet's by gate capacitance measurements |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/61928 |
| _version_ |
1821183490922643456 |