Extraction of semiconductor dopant profiles from spreading resistance data: An inverse problem
10.1016/0038-1101(90)90192-H
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Main Authors: | Choo, S.C., Leong, M.S., Liem, C.B.T., Kong, K.C. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62175 |
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Institution: | National University of Singapore |
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