Extraction of semiconductor dopant profiles from spreading resistance data: An inverse problem

10.1016/0038-1101(90)90192-H

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Bibliographic Details
Main Authors: Choo, S.C., Leong, M.S., Liem, C.B.T., Kong, K.C.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62175
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Institution: National University of Singapore

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