Investigation of capacitive coupling voltage contrast using a specimen charging model
Microelectronic Engineering
Saved in:
Main Authors: | Sim, K., Chan, D., Phang, J. |
---|---|
Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62353 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Investigation of capacitive coupling voltage contrast using a specimen charging model
by: Sim, K., et al.
Published: (2014) -
Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
by: Wong, W.K., et al.
Published: (2014) -
Error voltage components in quantitative voltage contrast measurement systems
by: Chan, D.S.H., et al.
Published: (2014) -
Investigation of some aspects of the liquid crystal optical voltage contrast technique for integrated circuit physical analysis
by: Chim, W.K., et al.
Published: (2014) -
A simulation model for electron irradiation induced specimen charging in a scanning electron microscope
by: Chan, D.S.H., et al.
Published: (2014)