Applications of scanning near-field photon emission microscopy

Applications of scanning near-field photon emission microscopy

10.1109/IPFA.2009.5232566

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書目詳細資料
Main Authors:	Isakov, D.V., Tan, B.W.M., Phang, J.C.H., Yeo, Y.C., Tio, A.A.B., Zhang, Y., Geinzer, T., Balk, L.J.
其他作者:	ELECTRICAL & COMPUTER ENGINEERING
格式:	Conference or Workshop Item
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/69439
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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