Feedback control applied to improve convergence of performance-based optical proximity correction in advanced lithography
Proceedings of the 12th IASTED International Conference on Control and Applications, CA 2010
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Main Authors: | Qu, Y., Tay, A., Lee, T.H. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70326 |
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Institution: | National University of Singapore |
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