Deep level states caused by dislocations in MBE grown p-InGaAs/GaAs heterostructures
International Symposium on IC Technology, Systems and Applications
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Main Authors: | Du, A.Y., Li, M.F., Chong, T.C., Teo, K.L., Lau, W.S. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72554 |
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Institution: | National University of Singapore |
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