Hole quantization effects and threshold voltage shift in pMOSFET - Assessed by improved one-band effective mass approximation
10.1109/16.925246
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Main Authors: | Hou, Y.T., Li, M.-F. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80543 |
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Institution: | National University of Singapore |
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