Strong influence of SiO2 thin film on properties of GaN epilayers

Strong influence of SiO2 thin film on properties of GaN epilayers

Applied Physics Letters

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Bibliographic Details
Main Authors:	Wang, X.C., Xu, S.J., Chua, S.J., Li, K., Zhang, X.H., Zhang, Z.H., Chong, K.B., Zhang, X.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81219
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Institution:	National University of Singapore

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