BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric

BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric

Technical Digest - International Electron Devices Meeting, IEDM

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Main Authors: Wu, N., Zhang, Q., Zhu, C., Shen, C., Li, M.F., Chan, D.S.H., Balasubramanian, N.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83524
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-835242015-02-08T18:45:12Z BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric Wu, N. Zhang, Q. Zhu, C. Shen, C. Li, M.F. Chan, D.S.H. Balasubramanian, N. ELECTRICAL & COMPUTER ENGINEERING Technical Digest - International Electron Devices Meeting, IEDM 2005 555-558 TDIMD 2014-10-07T04:42:12Z 2014-10-07T04:42:12Z 2005 Conference Paper Wu, N.,Zhang, Q.,Zhu, C.,Shen, C.,Li, M.F.,Chan, D.S.H.,Balasubramanian, N. (2005). BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric. Technical Digest - International Electron Devices Meeting, IEDM 2005 : 555-558. ScholarBank@NUS Repository. 078039268X 01631918 http://scholarbank.nus.edu.sg/handle/10635/83524 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Technical Digest - International Electron Devices Meeting, IEDM
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Wu, N.
Zhang, Q.
Zhu, C.
Shen, C.
Li, M.F.
Chan, D.S.H.
Balasubramanian, N.
format Conference or Workshop Item
author Wu, N.
Zhang, Q.
Zhu, C.
Shen, C.
Li, M.F.
Chan, D.S.H.
Balasubramanian, N.
spellingShingle Wu, N.
Zhang, Q.
Zhu, C.
Shen, C.
Li, M.F.
Chan, D.S.H.
Balasubramanian, N.
BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric
author_sort Wu, N.
title BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric
title_short BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric
title_full BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric
title_fullStr BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric
title_full_unstemmed BTI and charge trapping in germanium p- And n-MOSFETs with CVD HfO 2 gate dielectric
title_sort bti and charge trapping in germanium p- and n-mosfets with cvd hfo 2 gate dielectric
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83524
_version_ 1681089451793580032

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