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Constant current-stress induced breakdown of reoxidized nitrided oxide (ONO) in Flash memory devices
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by Liang, Y., Jensen, T.W., Roy, E.J., Cha, C., DeVolder, R.J., Kohman, R.E., Zhang, B.Z., Textor, K.B., Rund, L.A., Schook, L.B., Tong, Y.W., Kong, H.
Published 2014
Get full textPublished 2014
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by Liang, Y., Jensen, T.W., Roy, E.J., Cha, C., DeVolder, R.J., Kohman, R.E., Zhang, B.Z., Textor, K.B., Rund, L.A., Schook, L.B., Tong, Y.W., Kong, H.
Published 2014
Get full textPublished 2014
Article