RF performance benchmarking of TSV integrated surface electrode ion trap for quantum computing
Surface electrode ion trap is highly promising for practical quantum computing due to its superior controllability on the trapped ions. With advanced microfabrication techniques, silicon has been developed as ion trap substrate for delicate surface electrodes design as well as monolithic electro-opt...
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| Main Authors: | , , , , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2021
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/153006 |
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| Institution: | Nanyang Technological University |
| Language: | English |