Electrical characterization of GaN-based layer structures
Wide band gap semiconductors are attractive for several microelectronic and photonic applications such as high power amplifiers, LEDs and laser diodes. Particularly, GaN-based semiconductors are promising as they exhibit attractive properties such as low intrinsic carrier concentration and high ther...
Saved in:
Main Author: | Firdous Banu |
---|---|
Other Authors: | K Radhakrishnan |
Format: | Final Year Project |
Language: | English |
Published: |
2011
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/45886 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Electrical characterization of GaN-based Schottky diodes
by: Muhamad Nursharil Zaini.
Published: (2009) -
Electrical and structural characterization of GaN based semiconductor layers
by: Lee, Pui Ki.
Published: (2011) -
Electrical characterisation of GaN-based metal semiconductor contacts
by: Lee, Kenneth Jia De.
Published: (2010) -
Structural and electrical characterization of GaN based hetero-structures
by: Agarwal, Ananya
Published: (2013) -
Defect characterization of GaN-based materials’ surface using Python
by: Ng, Shawn Jun Kai
Published: (2023)