Study of degradation mechanism of metal nanocrystal-based gate stacks
This thesis focuses on the degradation and reliability mechanism of the metal nanocrystal-based Al2O3/SiO2 gate stacks which is believed to be a promising candidate for next generation nonvolatile memory. A series of novel approaches were used to obtain in-depth knowledge of the gate stack in terms...
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Main Author: | Chen, Yining |
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Other Authors: | Goh Kuan Eng, Johnson |
Format: | Theses and Dissertations |
Language: | English |
Published: |
2012
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/49981 |
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Institution: | Nanyang Technological University |
Language: | English |
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