1.3-μm In(Ga)As quantum-dot VCSELs fabricated by dielectric-free approach with surface-relief process

We present the 1.3-μ m In(Ga)As quantum-dot (QD) vertical-cavity surface-emitting lasers (VCSELs) fabricated by the dielectric-free (DF) approach with the surface-relief (SR) process. Compared with the conventional dielectric-dependent (DD) method, the lower differential resistance and improved outp...

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Bibliographic Details
Main Authors: Yoon, Soon Fatt, Tong, Cunzhu, Fan, Weijun, Ding, Y., Zhao, L. J., Xu, D. W.
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2011
Subjects:
Online Access:https://hdl.handle.net/10356/92287
http://hdl.handle.net/10220/6756
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Institution: Nanyang Technological University
Language: English

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