Excimer laser-induced Ti silicidation to eliminate the fine-line effect for integrated circuit device fabrication
10.1149/1.1510843
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Main Authors: | Chen, S.Y., Shen, Z.X., Xu, S.Y., Ong, C.K., See, A.K., Chan, L.H. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/113079 |
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Institution: | National University of Singapore |
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