AES analysis of nitridation of Si(100) by 2-10 keV N+ 2 ion beams
Applied Surface Science
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Main Authors: | Pan, J.S., Wee, A.T.S., Huan, C.H.A., Tan, H.S., Tan, K.L. |
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Other Authors: | INST OF MATERIALS RESEARCH & ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/113226 |
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Institution: | National University of Singapore |
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