AES analysis of nitridation of Si(100) by 2-10 keV N+ 2 ion beams

Applied Surface Science

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Bibliographic Details
Main Authors: Pan, J.S., Wee, A.T.S., Huan, C.H.A., Tan, H.S., Tan, K.L.
Other Authors: INST OF MATERIALS RESEARCH & ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/113226
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Institution: National University of Singapore

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