A simulation and electrical characterization of the low-voltage LDMOSFET
Master's
Saved in:
Main Author: | TAN SWEE THIAN |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Theses and Dissertations |
Language: | English |
Published: |
2010
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/13743 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Language: | English |
Similar Items
-
The partial silicon-on-insulator technology for RF power LDMOSFET devices and on-chip microinductors
by: Ren, C., et al.
Published: (2014) -
Characterization of hot carrier reliability in deep submicronmeter MOSFETs
by: LIAO HONG
Published: (2010) -
Modelling of the "Gated-diode" configuration in bulk MOSFET's
by: Yip, A., et al.
Published: (2014) -
Modelling of the "Gated-diode" configuration in bulk MOSFET's
by: Yip, A., et al.
Published: (2014) -
A novel experimental technique for the lateral profiling of oxide and interface state charges in hot-hole degraded N-MOSFET's
by: Ang, D.S., et al.
Published: (2014)