Spot focus size effect in spectroscopic ellipsometry of thin films

10.1016/j.optcom.2008.09.081

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Bibliographic Details
Main Authors: Ng, T.W., Tay, A., Wang, Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57497
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Institution: National University of Singapore

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