Spot focus size effect in spectroscopic ellipsometry of thin films
10.1016/j.optcom.2008.09.081
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Main Authors: | Ng, T.W., Tay, A., Wang, Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/57497 |
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Institution: | National University of Singapore |
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