Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysis
10.1117/12.280557
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Main Authors: | Osipowicz, T., Sanchez, J.L., FWatt, Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72575 |
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Institution: | National University of Singapore |
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