Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique

Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique

10.1117/12.405371

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書目詳細資料
Main Authors:	Zhang, Z., Tan, L.S., Koh, S.M., Liu, H.M., Flottmann, D.
其他作者:	ELECTRICAL ENGINEERING
格式:	Conference or Workshop Item
出版:	2014
主題:	Laser-microwave photoconductance decay Minority carrier diffusion length Surface photovoltage
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/72597
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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