Vapor pressure assisted interface delamination and failure of plastic IC packages - A micromechanics approach
Advances in Electronic Packaging
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Main Authors: | Chong, C.W., Guo, T.F., Cheng, L. |
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Other Authors: | MATERIALS SCIENCE |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/74001 |
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Institution: | National University of Singapore |
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