Effect of Cu contamination on electrical characteristics for PMOS transistors

بواسطة Tee, K.C., Prasad, K., Lee, C.S., Gong, H., Chan, L., See, A.K.
منشور في 2014

Correspondence: Effects of deliberate copper contamination from the plating solution on the electrical characteristics of MOSFETs

بواسطة Tee, K.C., Prasad, K., Lee, C.S., Gong, H., Cha, C.L., Chan, L., See, A.K.
منشور في 2014

Uniform void-free epitaxial CoSi 2 formation on STI bounded narrow Si(lOO) lines by template layer stress reduction

بواسطة Ho, C.S., Pey, K.L., Tung, C.H., Zhang, B.C., Tee, K.C., Karunasiri, G., Chua, S.J.
منشور في 2014

Laser-induced formation of titanium silicides

بواسطة Chen, S.Y., Shen, Z.X., Chen, Z.D., See, A.K., Chan, L.H., Zhang, T.J., Tee, K.C.
منشور في 2014

SDODEL MOSFET for performance enhancement

بواسطة Chui, K.J., Samudra, G.S., Yeo, Y.-C., Tee, K.-C., Leong, K.-W., Tee, K.M., Benistant, F., Chan, L.
منشور في 2014

Effect of processing parameters on electroless Cu seed layer properties

بواسطة Chen, Z., Chan, L., See, Alex K. H., Law, S. B., Zeng, K. Y., Shen, L., Tee, K. C., Ee, Elden Yong Chiang
منشور في 2012

Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid

بواسطة Cha, C.-L., Tee, K.-C., Chor, E.-F., Gong, H., Prasad, K., Bourdillon, A.J., See, A., Chan, L., Lee, M.M.-O.
منشور في 2014

Thermal studies on stress-induced void-like defects in epitaxial-CoSi 2 formation

بواسطة Ho, C.S., Pey, K.L., Tung, C.H., Tee, K.C., Prasad, K., Saigal, D., Tan, J.J.L., Wong, H., Lee, K.H., Osipowicz, T., Chua, S.J., Karunasiri, R.P.G.
منشور في 2014