Effect of Cu contamination on electrical characteristics for PMOS transistors

由 Tee, K.C., Prasad, K., Lee, C.S., Gong, H., Chan, L., See, A.K.
出版 2014

Correspondence: Effects of deliberate copper contamination from the plating solution on the electrical characteristics of MOSFETs

由 Tee, K.C., Prasad, K., Lee, C.S., Gong, H., Cha, C.L., Chan, L., See, A.K.
出版 2014

Uniform void-free epitaxial CoSi 2 formation on STI bounded narrow Si(lOO) lines by template layer stress reduction

由 Ho, C.S., Pey, K.L., Tung, C.H., Zhang, B.C., Tee, K.C., Karunasiri, G., Chua, S.J.
出版 2014

Laser-induced formation of titanium silicides

由 Chen, S.Y., Shen, Z.X., Chen, Z.D., See, A.K., Chan, L.H., Zhang, T.J., Tee, K.C.
出版 2014

SDODEL MOSFET for performance enhancement

由 Chui, K.J., Samudra, G.S., Yeo, Y.-C., Tee, K.-C., Leong, K.-W., Tee, K.M., Benistant, F., Chan, L.
出版 2014

Effect of processing parameters on electroless Cu seed layer properties

由 Chen, Z., Chan, L., See, Alex K. H., Law, S. B., Zeng, K. Y., Shen, L., Tee, K. C., Ee, Elden Yong Chiang
出版 2012

Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid

由 Cha, C.-L., Tee, K.-C., Chor, E.-F., Gong, H., Prasad, K., Bourdillon, A.J., See, A., Chan, L., Lee, M.M.-O.
出版 2014

Thermal studies on stress-induced void-like defects in epitaxial-CoSi 2 formation

由 Ho, C.S., Pey, K.L., Tung, C.H., Tee, K.C., Prasad, K., Saigal, D., Tan, J.J.L., Wong, H., Lee, K.H., Osipowicz, T., Chua, S.J., Karunasiri, R.P.G.
出版 2014