Decapsulation of IC packages with silver wire bonds for failure analysis

Failure analysis in Integrated Circuits (IC) packages has always played a vital role in supporting manufacturing modules in the semiconductor industry. Failure analysis can provide essential information on product failure modes that ensure the employment of accurate corrective actions to improve qua...

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Bibliographic Details
Main Author: Matthews, Lynzen
Other Authors: Gan Chee Lip
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2023
Subjects:
Online Access:https://hdl.handle.net/10356/166877
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Institution: Nanyang Technological University
Language: English

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