Unified AC charge and DC current modeling for very-deep-submicron CMOS technology

• Main Author: Chiah, Siau Ben
• Other Authors: Zhou Xing
• Format: Theses and Dissertations
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• Online Access: https://hdl.handle.net/10356/3534
• Institution: Nanyang Technological University

A novel approach to formulating unified charge and drain current models for MOSFETs is presented. The charge modeling methodology is based on three regional surface-potential solutions, which describes three operating regions in MOSFETs. The modeling approach is extended to all regions with an expl...