Improved effective channel length extraction method for 0.09-0.13 mm CMOS

This work involves the detailed study and understanding of physical limits and shortcoming of existing electrical parameter extraction methodology i.e. effective channel length (Leff) extraction. This work not only improves and overcomes the limit of an existing Leff extraction method. In fact, an o...

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Bibliographic Details
Main Author: Eng, Chee Wee
Other Authors: Lau Wai Shing
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:https://hdl.handle.net/10356/4118
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Institution: Nanyang Technological University

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