Characterization of silicon nanocrystals embedded in SiO2 matrix

Characterization of silicon nanocrystals embedded in SiO2 matrix

In this thesis, we have synthesized Si nanocrystals (nc-Si) embedded in SiO2 films by implanting Si+ into SiO2 films that are thermally grown on Si substrates.

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書目詳細資料
主要作者:	Liu, Yang
其他作者:	Chen Tupei
格式:	Theses and Dissertations
出版:	2008
主題:	DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
在線閱讀:	https://hdl.handle.net/10356/4750
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	Nanyang Technological University

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