Simulating the electron beam induced current (EBIC) effect in a computer

Simulating the electron beam induced current (EBIC) effect in a computer

Electron-Beam-Induced Current (EBIC) is a technique that makes use of the induced current generated as the result of the electron beam bombardment upon the specimen for semiconductor materials and devices characterisation. Material characterisation is one of the important fields i...

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書目詳細資料
主要作者:	Lim, Wei lun
其他作者:	Ong Keng Sian, Vincent
格式:	Final Year Project
語言:	English
出版:	2012
主題:	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
在線閱讀:	http://hdl.handle.net/10356/49296
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	Nanyang Technological University
語言:	English

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