Reduced temperature electrical measurement of semiconductor devices

Reduced temperature electrical measurement of semiconductor devices

This report introduce the research status of thermoelectric cooling on semiconductors such as diode and semiconductor wafer. Measurement of current-voltage characteristic of semiconductor diodes by applying thermoelectric cooling device to determine how temperature affects its quality and operation....

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書目詳細資料
主要作者:	Ang, Derrick Jia Hao
其他作者:	Wong Kin Shun, Terence
格式:	Final Year Project
語言:	English
出版:	2015
主題:	DRNTU::Engineering::Electrical and electronic engineering
在線閱讀:	http://hdl.handle.net/10356/63816
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	Nanyang Technological University
語言:	English

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