Development of a 3D optical testing system for the study of IC packaging

The main objective of this study is to develop an advanced 3-D optical testing system to measure the deformations of IC packages accurately and comprehensively. The present study consists of two parts: 1) development and construction of an advanced compact 3-D optical testing system; and 2) applicat...

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Bibliographic Details
Main Author: Su, Fei.
Other Authors: Chian, Kerm Sin
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/6408
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Institution: Nanyang Technological University

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