Development of a 3D optical testing system for the study of IC packaging
The main objective of this study is to develop an advanced 3-D optical testing system to measure the deformations of IC packages accurately and comprehensively. The present study consists of two parts: 1) development and construction of an advanced compact 3-D optical testing system; and 2) applicat...
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Main Author: | Su, Fei. |
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Other Authors: | Chian, Kerm Sin |
Format: | Theses and Dissertations |
Published: |
2008
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/6408 |
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Institution: | Nanyang Technological University |
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