Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides
Annual Proceedings - Reliability Physics (Symposium)
Saved in:
| Main Authors: | , , , , , , , |
|---|---|
| Other Authors: | |
| Format: | Conference or Workshop Item |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/112982 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-112982 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-1129822024-11-09T03:27:06Z Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides Palumbo, F. Lombardo, S. Pey, K.L. Tang, L.J. Tung, C.H. Lin, W.H. Radhakrishnan, M.K. Falci, G. INSTITUTE OF MICROELECTRONICS Annual Proceedings - Reliability Physics (Symposium) 583-584 ARLPB 2014-11-28T08:12:58Z 2014-11-28T08:12:58Z 2004 Conference Paper Palumbo, F.,Lombardo, S.,Pey, K.L.,Tang, L.J.,Tung, C.H.,Lin, W.H.,Radhakrishnan, M.K.,Falci, G. (2004). Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides. Annual Proceedings - Reliability Physics (Symposium) : 583-584. ScholarBank@NUS Repository. 00999512 http://scholarbank.nus.edu.sg/handle/10635/112982 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Annual Proceedings - Reliability Physics (Symposium) |
| author2 |
INSTITUTE OF MICROELECTRONICS |
| author_facet |
INSTITUTE OF MICROELECTRONICS Palumbo, F. Lombardo, S. Pey, K.L. Tang, L.J. Tung, C.H. Lin, W.H. Radhakrishnan, M.K. Falci, G. |
| format |
Conference or Workshop Item |
| author |
Palumbo, F. Lombardo, S. Pey, K.L. Tang, L.J. Tung, C.H. Lin, W.H. Radhakrishnan, M.K. Falci, G. |
| spellingShingle |
Palumbo, F. Lombardo, S. Pey, K.L. Tang, L.J. Tung, C.H. Lin, W.H. Radhakrishnan, M.K. Falci, G. Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides |
| author_sort |
Palumbo, F. |
| title |
Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides |
| title_short |
Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides |
| title_full |
Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides |
| title_fullStr |
Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides |
| title_full_unstemmed |
Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides |
| title_sort |
structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/112982 |
| _version_ |
1821223546115850240 |