Trap signatures of As precipitates and As-antisite-related defects in GaAs epilayers grown by molecular beam epitaxy at low temperatures
Applied Physics Letters
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Main Authors: | Goo, C.H., Lau, W.S., Chong, T.C., Tan, L.S. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/114535 |
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Institution: | National University of Singapore |
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