Effects of annealing on the valence band offsets between hafnium aluminate and silicon
10.1063/1.2982085
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Main Authors: | Chiam, S.Y., Chim, W.K., Ren, Y., Pi, C., Pan, J.S., Huan, A.C.H., Wang, S.J., Zhang, J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55772 |
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Institution: | National University of Singapore |
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