Characterization of traps in semi-insulating gallium arsenide buffer layers grown at low temperature by molecular beam epitaxy with an improved zero-bias thermally stimurated current technique
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Saved in:
Main Authors: | Lau, Wai Shing, Chong, Tow Chong, Tan, Leng Seow, Goo, Chuen Hang, Goh, Kian Seng |
---|---|
Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/61933 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Quantitative detection of oxygen contamination related traps in gallium arsenide epitaxial layer grown by molecular beam epitaxy at low temperature
by: Lau, Wai Shing, et al.
Published: (2014) -
Study of electron traps in semi-insulating gallium-arsenide buffer layers for the suppression of backgating by the zero-bias thermally stimulated current technique
by: Lau, W.S., et al.
Published: (2014) -
Study of traps in semi-insulating III-V epitaxial films by zero bias transient current spectroscopy
by: Lau, W.S., et al.
Published: (2014) -
Fabrication of p-MOSFETs on germanium epitaxially grown on gallium arsenide substrate by chemical vapor deposition
by: Zhu, M., et al.
Published: (2014) -
Development and characterization of gallium arsenide-based antimony-containing dilute nitride grown by molecular beam epitaxy
by: Satrio Wicaksono
Published: (2010)