Effect of transmission line pulsing of interconnects investigated using combined low-frequency noise and resistance measurements

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

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Bibliographic Details
Main Authors: Chu, L.W., Chim, W.K., Pey, K.L., See, A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70090
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Institution: National University of Singapore

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