Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiency

Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiency

Diffusion and Defect Data Pt.B: Solid State Phenomena

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書目詳細資料
Main Authors:	Phang, J.C.H., Chan, D.S.H., Chim, W.K., Liu, Y.Y., Liu, X.
其他作者:	ELECTRICAL ENGINEERING
格式:	Article
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/80314
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	National University of Singapore

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