Study of implanted boron distribution in p+n structures using scanning capacitance microscopy
10.1117/12.405388
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Main Authors: | Teo, Y.L., Pey, K.L., Chim, W.K., Chong, Y.F. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81769 |
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Institution: | National University of Singapore |
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