Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescence
10.1063/1.122803
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Main Authors: | Liu, X., Chan, D.S.H., Chim, W.K., Phang, J.C.H. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Review |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81818 |
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Institution: | National University of Singapore |
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