Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescence

Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescence

10.1063/1.122803

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書目詳細資料
Main Authors:	Liu, X., Chan, D.S.H., Chim, W.K., Phang, J.C.H.
其他作者:	ELECTRICAL ENGINEERING
格式:	Review
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/81818
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	National University of Singapore

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