Origin of charge trapping in germanium nanocrystal embedded SiO 2 system: Role of interfacial traps?

10.1063/1.1645639

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Bibliographic Details
Main Authors: Kan, E.W.H., Choi, W.K., Chim, W.K., Fitzgerald, E.A., Antoniadis, D.A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82851
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Institution: National University of Singapore

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