X-ray photoemission spectroscopy study of silicidation of Ti on BF2 +-implanted polysilicon
10.1116/1.1421565
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Main Authors: | Chua, H.N., Pey, K.L., Lai, W.H., Chai, J.W., Pan, J.S., Chua, D.H.C., Siah, S.Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83281 |
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Institution: | National University of Singapore |
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