Application of modified virtual crack closure method on delamination analysis in a plastic IC package during lead-free solder reflow
Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
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Main Authors: | Hu, G., Tay, A.A.O. |
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Other Authors: | MECHANICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/85883 |
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Institution: | National University of Singapore |
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