LTspice implementation of PKU compact model of metal-oxide-based RRAM : part A simulation of DC current-voltage characteristics of RRAM device

Resistive-switching random access memory (RRAM) is a kind of nonvolatile memory (NVM) that is based on resistance changes to store data. The concept is not new, but the interest of IC industry in RRAM has been grown during recent years due to RRAM’s potential advantages of high density, high sp...

Full description

Saved in:
Bibliographic Details
Main Author: Su, Ziheng
Other Authors: Chen Tupei
Format: Thesis-Master by Coursework
Language:English
Published: Nanyang Technological University 2021
Subjects:
Online Access:https://hdl.handle.net/10356/153654
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English

Similar Items