The Effect of Intrinsic Defects on Resistive Switching Based on p–n Heterojunction
We report a unidirectional bipolar resistive switching in an n-type GaO x /p-type NiO x heterojunction fabricated by magnetron sputtering at room temperature. The resistive switching (RS) of the heterojunction directly relate with the concentration of intrinsic defects in oxide, such as oxygen vacan...
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Main Authors: | Zheng, K., Sun, Xiao Wei, Teo, K. L. |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2015
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/81343 http://hdl.handle.net/10220/39214 |
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Institution: | Nanyang Technological University |
Language: | English |
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